Defect detection in high-resolution imagery using two-stage Amazon Rekognition Custom Labels models

High-resolution imagery is very prevalent in today’s world, from satellite imagery to drones and DLSR cameras. From this imagery, we can capture damage due to natural disasters, anomalies in manufacturing equipment, or very small defects such as defects on printed circuit boards (PCBs) or semiconductors. Building anomaly detection models using high-resolution imagery can be challenging […]

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